JOURNAL ARTICLE

<title>Thin metal film thermal microsensors</title>

Yuli VladimirskyNicholas RauHarish ManoharaKevin J. MorrisJ. Michael KlopfGina M. CalderonOlga Vladimirsky

Year: 1995 Journal:   Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Vol: 2640 Pages: 184-192   Publisher: SPIE

Abstract

Design, fabrication, and testing of thermal micro-sensors suitable for miniature and microscopic systems, for application on thin films (free standing or on substrates) as temperature sensors are presented in this paper. The sensors utilize the electrical resistivity temperature dependence of a metal. Using micro-lithography methods, several sets of gold resistors were fabricated in the form of flat 30 to 250 nm thick wires, 7 - 10 micrometers wide, and several cm long in a serpentine shape covering approximately 1.0 mm2. These sensors have demonstrated better than 0.001 degree(s) C sensitivity. The electrical resistivity and its thermal coefficient of a thin gold metal film were compared with those of bulk material. Temperature measurements on Si wafers were performed in situations corresponding to x-ray lithography exposure conditions suitable for micromachining. The temperature rise and relaxation time of a silicon wafer during x-ray exposure were measured in vacuum and different He gas pressures.

Keywords:
Wafer Materials science Lithography Electrical resistivity and conductivity Thin film Surface micromachining Temperature coefficient Fabrication Resistor Silicon Optoelectronics Thermal Nanotechnology Composite material Electrical engineering

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Topics

Gas Sensing Nanomaterials and Sensors
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Advanced Sensor Technologies Research
Physical Sciences →  Engineering →  Biomedical Engineering
Advanced MEMS and NEMS Technologies
Physical Sciences →  Engineering →  Electrical and Electronic Engineering

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