XPS study of palladium sensitized nano porous silicon thin film

J. Kanungo; Linnéa Selegård; Cecilia Vahlberg; Kajsa Uvdal; H. Saha; S. Basu

doi:10.1007/s12034-011-0138-9

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XPS study of palladium sensitized nano porous silicon thin film

J. Kanungo Linnéa Selegård Cecilia Vahlberg Kajsa Uvdal H. Saha S. Basu

Year: 2010 Journal: Bulletin of Materials Science Vol: 33 (6)Pages: 647-651 Publisher: Springer Science+Business Media

DOI: 10.1007/s12034-011-0138-9

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Keywords:

Materials science X-ray photoelectron spectroscopy Palladium Porous silicon Silicon Nanoporous Anodizing Chemical engineering Monocrystalline silicon Chemical state Thin film Analytical Chemistry (journal) Nanotechnology Composite material Metallurgy Catalysis Aluminium Organic chemistry

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Silicon Nanostructures and Photoluminescence

Physical Sciences → Materials Science → Materials Chemistry

Semiconductor materials and devices

Physical Sciences → Engineering → Electrical and Electronic Engineering

Nanowire Synthesis and Applications

Physical Sciences → Engineering → Biomedical Engineering

XPS study of palladium sensitized nano porous silicon thin film

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