Vacuum-ultraviolet radiation damage of the KCl surface—application of combined spectroscopic ellipsometry and reflectometry

V. M. Bermudez

doi:10.1016/0039-6028(78)90015-8

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Vacuum-ultraviolet radiation damage of the KCl surface—application of combined spectroscopic ellipsometry and reflectometry

V. M. Bermudez

Year: 1978 Journal: Surface Science Vol: 74 (3)Pages: 568-594 Publisher: Elsevier BV

DOI: 10.1016/0039-6028(78)90015-8

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Keywords:

Reflectometry Ellipsometry Ultraviolet Layer (electronics) Radiation Surface layer Absorption (acoustics) Chemistry Materials science Molecular physics Analytical Chemistry (journal) Thin film Optics Atomic physics Optoelectronics Physics Nanotechnology

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Vacuum-ultraviolet radiation damage of the KCl surface—application of combined spectroscopic ellipsometry and reflectometry

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