X-ray phase tomography with a Talbot interferometer in combination with an X-ray imaging microscope

Abstract

An X-ray Talbot interferometer was combined with an X-ray imaging microscope to generate differential phase contrast. X-ray phase tomography was attained based on the measurement of the differential phase shift using the fringe scanning method. Polymer blend samples were observed and phase separation structures were depicted. The spatial resolution was 1.3 μm in this test experiment, which will be easily improved by increasing the magnification.