JOURNAL ARTICLE

High-resolution electron microscopy of the Σ = 5 [001] (310) grain boundary in NiAl

R. W. FondaDavid E. Luzzi

Year: 1993 Journal:   Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties Vol: 68 (6)Pages: 1151-1164   Publisher: Taylor & Francis

Abstract

Abstract The structure of a highly oriented NiAl Σ = 5 [001] (310) grain boundary has been imaged by high-resolution electron microscopy and analysed by multislice image calculations. This grain boundary exhibits an asymmetry produced by a rigid body displacement of approximately 1/2d 1 30 along the grain boundary, but does not show any measurable expansion of the grain boundary. The match between the simulated and experimental images of this grain boundary is improved by changing the stoichiometry of the boundary, which can be accomplished by adding antisite defects and vacancies. The final model structure incorporates 50% constitutional vacancies on the nickel sites adjacent to the boundary plane and a replacement of the aluminium sites adjacent to the boundary plane with 50% nickel antisite defects and 50% vacancies.

Keywords:
Grain boundary Nial Materials science Boundary (topology) Electron microscope Crystallography Condensed matter physics Metallurgy Microstructure Optics Chemistry Intermetallic Physics Mathematics Mathematical analysis

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Topics

Catalytic Processes in Materials Science
Physical Sciences →  Materials Science →  Materials Chemistry
Intermetallics and Advanced Alloy Properties
Physical Sciences →  Engineering →  Mechanical Engineering
nanoparticles nucleation surface interactions
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