Modeling of CMOS image sensors for time-of-flight applications

Adrian Driewer; B.J. Hosticka; Andreas Spickermann; H. Vogt

doi:10.1117/12.2178390

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JOURNAL ARTICLE

Modeling of CMOS image sensors for time-of-flight applications

Adrian Driewer B.J. Hosticka Andreas Spickermann H. Vogt

Year: 2015 Journal: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Vol: 9506 Pages: 950603-950603 Publisher: SPIE

DOI: 10.1117/12.2178390

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Abstract

Paper 950603, 9 S.

Keywords:

Image sensor Photodetector Photodiode Pixel Optoelectronics Charge-coupled device Charge (physics) SIGNAL (programming language) Charge carrier Field (mathematics) Optics Electric field Time of flight Irradiance Time delay and integration CMOS Materials science Physics Computer science

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Advanced Optical Sensing Technologies

Physical Sciences → Physics and Astronomy → Instrumentation

CCD and CMOS Imaging Sensors

Physical Sciences → Engineering → Electrical and Electronic Engineering

Analytical Chemistry and Sensors

Physical Sciences → Chemical Engineering → Bioengineering

Modeling of CMOS image sensors for time-of-flight applications

Abstract

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