JOURNAL ARTICLE
Structural characterization of impurified zinc oxide thin films
Liliana TrincaAurelian Catalin GalcaViorica StancuCristina ChirilăL. Pintilie
Year: 2014 Journal: AIP conference proceedings Vol: 1627 Pages: 123-128 Publisher: American Institute of Physics
Abstract
Europium doped zinc oxide (Eu:ZnO) thin films have been obtained by pulsed laser deposition (PLD). 002 textured thin films were achieved on glass and silicon substrates, while hetero-epilayers and homo-epilayers have been attained on single crystal SrTiO3 and ZnO, respectively. X-ray Diffraction (XRD) was employed to characterize the Eu:ZnO thin films. Extended XRD studies confirmed the different thin film structural properties as function of chosen substrates.
Keywords:
Thin film Materials science Zinc Pulsed laser deposition Europium Doping Diffraction Characterization (materials science) Silicon Deposition (geology) Optoelectronics Analytical Chemistry (journal) Chemical engineering Nanotechnology Optics Metallurgy Chemistry Luminescence
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Topics
ZnO doping and properties
Physical Sciences → Materials Science → Materials Chemistry
Ga2O3 and related materials
Physical Sciences → Materials Science → Electronic, Optical and Magnetic Materials
Electronic and Structural Properties of Oxides
Physical Sciences → Materials Science → Materials Chemistry
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