JOURNAL ARTICLE

Characteristics of Zirconium Oxide Gate Ion-Sensitive Field-Effect Transistors

Kow‐Ming ChangKuo-Yi ChaoTing-Wei ChouChin-Tien Chang

Year: 2007 Journal:   Japanese Journal of Applied Physics Vol: 46 (7R)Pages: 4333-4333   Publisher: Institute of Physics

Abstract

In this study, the zirconium oxide (ZrO2) membrane has been successfully applied as a pH-sensitive layer for ion-sensitive field-effect transistors (ISFETs). It exhibited an excellent response range of 56.7–58.3 mV/pH from the fixed current measurement using HP4156A. The ZrO2 membrane prepared by direct current (DC) sputtering was used as a pH-sensitive film that showed good surface adsorption with oxide and silicon. The pH sensitivities slightly decreased in 1 M NaCl solution; however, the device showed a perfect linear response of 52.5 mV/pH. The linear pH sensitivity response was measured between pH 1 to 13 in a buffer solution that was provided by Riedel–deHän.

Keywords:
Zirconium Field-effect transistor Analytical Chemistry (journal) Oxide Buffer solution Adsorption Silicon Membrane Materials science Transistor Ion Direct current Inorganic chemistry Chemistry Layer (electronics) Optoelectronics Nanotechnology Chromatography Electrical engineering Voltage Physical chemistry

Metrics

18
Cited By
1.82
FWCI (Field Weighted Citation Impact)
12
Refs
0.84
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Analytical Chemistry and Sensors
Physical Sciences →  Chemical Engineering →  Bioengineering
Gas Sensing Nanomaterials and Sensors
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Electrochemical Analysis and Applications
Physical Sciences →  Chemistry →  Electrochemistry

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