Enhancement in flaw detectability by means of lockin temporal speckle pattern interferometry and thermal waves

Andrés E. Dolinko; Guillermo H. Kaufmann

doi:10.1016/j.optlaseng.2006.11.002

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Enhancement in flaw detectability by means of lockin temporal speckle pattern interferometry and thermal waves

Andrés E. Dolinko Guillermo H. Kaufmann

Year: 2007 Journal: Optics and Lasers in Engineering Vol: 45 (6)Pages: 690-694 Publisher: Elsevier BV

DOI: 10.1016/j.optlaseng.2006.11.002

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Keywords:

Speckle pattern Waveform Interferometry Speckle imaging Electronic speckle pattern interferometry Optics Nondestructive testing Fourier transform Speckle noise Acoustics Thermal Materials science Computer science Physics Telecommunications

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Optical measurement and interference techniques

Physical Sciences → Computer Science → Computer Vision and Pattern Recognition

Thermography and Photoacoustic Techniques

Physical Sciences → Engineering → Mechanics of Materials

Integrated Circuits and Semiconductor Failure Analysis

Physical Sciences → Engineering → Electrical and Electronic Engineering

Enhancement in flaw detectability by means of lockin temporal speckle pattern interferometry and thermal waves

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