Optical Properties of Bismuth Telluride Thin Films, Bi2Te3/Si(100) and Bi2Te3/SiO2/Si(100)

El. H. Kaddouri; T. Maurice; X. Gratens; S. Charar; S. Bénet; A. Mefleh; J.C. Tédenac; B. Liautard

doi:10.1002/(sici)1521-396x(199912)176:2<1071::aid-pssa1071>3.0.co;2-e

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Optical Properties of Bismuth Telluride Thin Films, Bi2Te3/Si(100) and Bi2Te3/SiO2/Si(100)

El. H. Kaddouri T. Maurice X. Gratens S. Charar S. Bénet A. Mefleh J.C. Tédenac B. Liautard

Year: 1999 Journal: physica status solidi (a) Vol: 176 (2)Pages: 1071-1076 Publisher: Wiley

DOI: 10.1002/(sici)1521-396x(199912)176:2<1071::aid-pssa1071>3.0.co;2-e

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Keywords:

Bismuth telluride Materials science Refractive index Thin film Band gap Infrared Bismuth Attenuation coefficient Optoelectronics Absorption (acoustics) Optics Nanotechnology Composite material Seebeck coefficient Metallurgy

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Advanced Thermoelectric Materials and Devices

Physical Sciences → Materials Science → Materials Chemistry

Advanced Semiconductor Detectors and Materials

Physical Sciences → Engineering → Electrical and Electronic Engineering

Chalcogenide Semiconductor Thin Films

Physical Sciences → Engineering → Electrical and Electronic Engineering

Optical Properties of Bismuth Telluride Thin Films, Bi2Te3/Si(100) and Bi2Te3/SiO2/Si(100)

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