JOURNAL ARTICLE

Wide dynamic range CMOS image sensor with pixel level ADC

Jehyuk RheeYoung Hoon Joo

Year: 2003 Journal:   Electronics Letters Vol: 39 (4)Pages: 360-361   Publisher: Institution of Engineering and Technology

Abstract

A new enhanced dynamic range (DR) and signal-to-noise ratio (SNR) CMOS imaging system with a pixel level analogue-to-digital converter (ADC) is presented. The proposed reset technique and time-to-digital converter increases DR and peak SNR simultaneously. The circuit reuse concept is also proposed to increase the fill factor.

Keywords:
Dynamic range CMOS Pixel Image sensor Reset (finance) Wide dynamic range Analog-to-digital converter Electronic engineering Successive approximation ADC Signal-to-noise ratio (imaging) Range (aeronautics) Noise (video) Computer science Electrical engineering Engineering Comparator Image (mathematics) Artificial intelligence Voltage Telecommunications

Metrics

79
Cited By
4.70
FWCI (Field Weighted Citation Impact)
2
Refs
0.95
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

CCD and CMOS Imaging Sensors
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Image Processing Techniques and Applications
Physical Sciences →  Engineering →  Media Technology
Infrared Target Detection Methodologies
Physical Sciences →  Engineering →  Aerospace Engineering

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