Characterization of thin P-layer in pin hetero-junction solar cells

N. Fukada; Y. Hosokawa; M. Yamaguchi; Jun Takada; M. Kondō; Kentaro Nishimura; Y. Tawada

doi:10.1016/0022-3093(85)90933-0

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Characterization of thin P-layer in pin hetero-junction solar cells

N. Fukada Y. Hosokawa M. Yamaguchi Jun Takada M. Kondō Kentaro Nishimura Y. Tawada

Year: 1985 Journal: Journal of Non-Crystalline Solids Vol: 77-78 Pages: 1477-1480 Publisher: Elsevier BV

DOI: 10.1016/0022-3093(85)90933-0

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Keywords:

X-ray photoelectron spectroscopy Fermi level Layer (electronics) Materials science Deposition (geology) Analytical Chemistry (journal) Fermi Gamma-ray Space Telescope Thin film Solar cell Characterization (materials science) Conductivity Optoelectronics Chemistry Condensed matter physics Nanotechnology Nuclear magnetic resonance Physics Physical chemistry Electron

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Thin-Film Transistor Technologies

Physical Sciences → Engineering → Electrical and Electronic Engineering

Silicon and Solar Cell Technologies

Physical Sciences → Engineering → Electrical and Electronic Engineering

Semiconductor materials and interfaces

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Characterization of thin P-layer in pin hetero-junction solar cells

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