Characterization of ultrasharp field emitters by projection microscopy

M. Fransen; E. P. N. Damen; Christopher Schiller; T.L. van Rooy; H. B. Groen; P. Kruit

doi:10.1016/0169-4332(95)00358-4

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Characterization of ultrasharp field emitters by projection microscopy

M. Fransen E. P. N. Damen Christopher Schiller T.L. van Rooy H. B. Groen P. Kruit

Year: 1996 Journal: Applied Surface Science Vol: 94-95 Pages: 107-112 Publisher: Elsevier BV

DOI: 10.1016/0169-4332(95)00358-4

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Keywords:

Brightness Optics Common emitter Projection (relational algebra) Diffraction Materials science Microscopy Fresnel diffraction Physics Optoelectronics Mathematics

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Advanced Electron Microscopy Techniques and Applications

Life Sciences → Biochemistry, Genetics and Molecular Biology → Structural Biology

Electron and X-Ray Spectroscopy Techniques

Physical Sciences → Materials Science → Surfaces, Coatings and Films

Integrated Circuits and Semiconductor Failure Analysis

Physical Sciences → Engineering → Electrical and Electronic Engineering

Characterization of ultrasharp field emitters by projection microscopy

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