JOURNAL ARTICLE
Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope
Peng WangAngus I. KirklandPeter D. NellistA.J. D’AlfonsoAndrew J. MorganLeslie J. AllenAyako HashimotoMasaki TakeguchiKazutaka MitsuishiM. Shimojo
Year: 2012 Journal: Microscopy and Microanalysis Vol: 18 (S2)Pages: 532-533 Publisher: Oxford University Press
Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Keywords:
Scanning confocal electron microscopy Scanning transmission electron microscopy Electron microscope Transmission electron microscopy Optics Conventional transmission electron microscope Low-voltage electron microscope Materials science Microscopy Microscope Confocal Phoenix Microanalysis Electron Chemistry Physics Pathology Medicine Nuclear physics
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Topics
Advanced Electron Microscopy Techniques and Applications
Life Sciences → Biochemistry, Genetics and Molecular Biology → Structural Biology
Electron and X-Ray Spectroscopy Techniques
Physical Sciences → Materials Science → Surfaces, Coatings and Films
Advanced Fluorescence Microscopy Techniques
Life Sciences → Biochemistry, Genetics and Molecular Biology → Biophysics
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