JOURNAL ARTICLE

Strain Relaxation in Hexagonally Close-Packed Metal-Metal Interfaces

C. GüntherJ. VrijmoethR. Q. HwangR. Jürgen Behm

Year: 1995 Journal:   Physical Review Letters Vol: 74 (5)Pages: 754-757   Publisher: American Physical Society

Abstract

Scanning tunneling microscopy observations on epitaxial Cu/Ru(0001) show the relaxation of (tensile) lattice strain to occur in four different stages with increasing film thickness, from pseudomorphic to unilaterally contracted to (quasi-)isotropically contracted film structures, with decreasing lattice strain and increasing interface energy. The underlying film layers rearrange during growth. Comparison with other data suggests this scheme to be more generally valid for tensile and, with slight modifications, also compressive strain relaxation in hexagonally close-packed metal surfaces and metal-metal interfaces.

Keywords:
Materials science Tensile strain Epitaxy Metal Scanning tunneling microscope Ultimate tensile strength Relaxation (psychology) Lattice (music) Strain (injury) Condensed matter physics Composite material Strain energy Thin film Crystallography Nanotechnology Metallurgy Thermodynamics Chemistry

Metrics

224
Cited By
12.04
FWCI (Field Weighted Citation Impact)
16
Refs
0.99
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Copper Interconnects and Reliability
Physical Sciences →  Materials Science →  Electronic, Optical and Magnetic Materials
Metal and Thin Film Mechanics
Physical Sciences →  Engineering →  Mechanics of Materials
Magnetic properties of thin films
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics

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