Electrical conductivity, dielectric properties and structure of GeSe3Sb2Se3-ZnSe thin films

M.R. Balboul; Hany M. Hosni; M. Roushdy; S.A. Fayek

doi:10.1016/j.tsf.2013.06.095

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Electrical conductivity, dielectric properties and structure of GeSe3Sb2Se3-ZnSe thin films

M.R. Balboul Hany M. Hosni M. Roushdy S.A. Fayek

Year: 2013 Journal: Thin Solid Films Vol: 542 Pages: 310-316 Publisher: Elsevier BV

DOI: 10.1016/j.tsf.2013.06.095

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Keywords:

Dielectric Amorphous solid Activation energy Electrical resistivity and conductivity Materials science Conductivity Thin film Atmospheric temperature range Analytical Chemistry (journal) Dielectric loss Diffraction Range (aeronautics) Chemistry Optoelectronics Optics Composite material Nanotechnology Electrical engineering Crystallography Physical chemistry Thermodynamics Physics

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Phase-change materials and chalcogenides

Physical Sciences → Materials Science → Materials Chemistry

Solid-state spectroscopy and crystallography

Physical Sciences → Materials Science → Materials Chemistry

Crystal Structures and Properties

Physical Sciences → Materials Science → Electronic, Optical and Magnetic Materials

Electrical conductivity, dielectric properties and structure of GeSe3Sb2Se3-ZnSe thin films

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