Anickattu Somasekharan DivyaV. Kumar
We report a novel mechanism for the spontaneous transition to the ferroelectric (FE) phase in a typical relaxor, PLZT(8/65/35). Dielectric, FE, induced strain, and structural studies reveal the influence of acceptor dopant Cu 2+ on this transition. That this transition occurs under zero‐field conditions reveals yet another challenge in the use of copper metal electrodes for PLZT‐based thin‐film devices.
A. KrūminšTadashi ShiosakiA. PlaudeArnita Spule
B. VodopivecZdravko KutnjakC. FilipičA. LevstikJanez HolcMarija Kosec
Felix LeeSam GoljahiIan M. McKinleyChristopher S. LynchLaurent Pilon
C. FilipičB. VodopivecJanez HolcA. LevstikZdravko KutnjakH. Beige
Felix Y. LeeSam GoljahiIan M. McKinleyChristopher S. LynchLaurent Pilon