JOURNAL ARTICLE

Microwave characterization of vertically aligned multiwalled carbon nanotube arrays

Anestis KatsounarosKhalid Z. RajabYang HaoMark MannW. I. Milne

Year: 2011 Journal:   Applied Physics Letters Vol: 98 (20)   Publisher: American Institute of Physics

Abstract

Vertically aligned multiwalled carbon nanotube (VACNT) films have been characterized by rectangular waveguide measurements. The complex scattering parameters (S-parameters) are measured by a vector network analyzer at X-band frequencies. The effective complex permittivity and permeability of the VACNT films have been extracted. The extracted parameters are verified by full wave simulations and very good agreement has been obtained. The results of the systematic error analysis are presented and the errors are within the acceptable range. The performance of VACNT films as an absorber is examined, and comparison with the conventional carbon loaded materials shows that a 90% size reduction is possible while maintaining the same absorption level.

Keywords:
Materials science Carbon nanotube Permittivity Microwave Characterization (materials science) Nanotube Optoelectronics Scattering parameters Absorption (acoustics) Scattering Nanotechnology Composite material Optics Dielectric Computer science

Metrics

34
Cited By
4.73
FWCI (Field Weighted Citation Impact)
12
Refs
0.96
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Microwave Engineering and Waveguides
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Microwave and Dielectric Measurement Techniques
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Advanced Antenna and Metasurface Technologies
Physical Sciences →  Engineering →  Aerospace Engineering

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