JOURNAL ARTICLE

Magnesium Aluminate (MgAl2O4) by XPS

Brian R. Strohmeier

Year: 1994 Journal:   Surface Science Spectra Vol: 3 (2)Pages: 121-127   Publisher: American Institute of Physics

Abstract

The XPS spectra of materials containing both magnesium and aluminum can exhibit a number of spectral artifacts when using a Mg Kα x-ray source. These artifacts are easily observed in XPS spectra of magnesium aluminate (MgAl2O4, also known as magnesium aluminum oxide), which are presented in this article. For example, the Al 2p peak is overlapped by the Mg Kα x-ray satellites from the Mg 2s peak, and the Mg Kα x-ray induced Mg KLL Auger peak. In addition, the Mg 2p peak can be overlapped by a C 1s x-ray ghost line caused by stray Al Kα x-ray radiation when using a dual Mg/Al x-ray source. Because of these artifacts, the amounts of Mg and Al in such samples should be quantified (when using a Mg Kα x-ray source) using the Mg 2s and Al 2s peaks, respectively, which are free of these artifacts.

Keywords:
X-ray photoelectron spectroscopy Magnesium Spectral line X-ray Analytical Chemistry (journal) Auger Aluminium Oxide Materials science Aluminate Chemistry Metallurgy Nuclear magnetic resonance Physics Atomic physics Optics Cement

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Citation History

Topics

Electron and X-Ray Spectroscopy Techniques
Physical Sciences →  Materials Science →  Surfaces, Coatings and Films
X-ray Spectroscopy and Fluorescence Analysis
Physical Sciences →  Physics and Astronomy →  Radiation
Ion-surface interactions and analysis
Physical Sciences →  Engineering →  Computational Mechanics
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