In this paper a statistical approach for pattern recognition, based on a distance transformation, will be presented. The algorism enables multiclass rotation- and translation invariant pattern recognition and can be made optionally scale invariant. Beside the theory of the algorithm we will present some practical application examples and propose a system architecture for a high speed hardware implementation including an ASIC architecture.
Henri H. ArsenaultYuan-Neng HsuKatarzyna Chałasińska-MacukowYusheng Yang
Donald PrévostMichel DoucetAlain BergeronLuc VeilleuxPaul C. ChevretteDenis Gingras
Adolf W. LohmannDavid Mendlovic
V. E. GauselmanVadim D. GleserNikolay A. KaliteevskijВ. Е. Семенов
Ha-Woon LeeSoo–Joong KimJeong-Woo KimYang-Hoi Doh