Analysis of Y1Ba2Cu3O7−y thin films on sapphire substrates made by electron beam evaporation

A.J.G. Schellingerhout; R.H.M. van de Leur; D. Schalkoord; D. van der Marel; J. E. Mooij

doi:10.1007/bf01310837

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Analysis of Y1Ba2Cu3O7−y thin films on sapphire substrates made by electron beam evaporation

A.J.G. Schellingerhout R.H.M. van de Leur D. Schalkoord D. van der Marel J. E. Mooij

Year: 1988 Journal: Zeitschrift für Physik B Condensed Matter Vol: 71 (1)Pages: 1-5 Publisher: Springer Nature

DOI: 10.1007/bf01310837

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Keywords:

Auger electron spectroscopy Annealing (glass) Scanning electron microscope Analytical Chemistry (journal) Electron microprobe Materials science Electron beam physical vapor deposition Thin film Sapphire Oxygen Microanalysis Copper Chemical vapor deposition Chemistry Metallurgy Composite material Optics Nanotechnology

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Physics of Superconductivity and Magnetism

Physical Sciences → Physics and Astronomy → Condensed Matter Physics

Magnetic properties of thin films

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Copper Interconnects and Reliability

Physical Sciences → Materials Science → Electronic, Optical and Magnetic Materials

Analysis of Y1Ba2Cu3O7−y thin films on sapphire substrates made by electron beam evaporation

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