JOURNAL ARTICLE

Analysis of a Capacitively Coupled Dual-Frequency CF4Discharge

Zoltán DonkóZoran Petrović

Year: 2006 Journal:   Japanese Journal of Applied Physics Vol: 45 (10S)Pages: 8151-8151   Publisher: Institute of Physics

Abstract

We present particle-in-cell simulations of capacitively-coupled CF 4 RF discharges. For establishing the discharge plasma high frequency sources of either 13.56 or 100 MHz are used, while a low frequency 0.7–1.0 MHz source is applied for biasing. The simulation results demonstrate that an efficient decoupling between the plasma and the biasing sources can be achieved by optimizing the choice of frequencies. The decoupling is observed by a small effect of varying of the biasing voltages of the RF sources on properties of the bulk of the plasma and the flux of the CF 3 + ions hitting the electrodes, while the mean energy of ions increases with the biasing voltage. The 100 MHz/1 MHz case allows setting of these ion properties in an especially wide range. For high values of the low-(biasing) frequency RF voltage a small flux of energetic negative ions is also observed at the electrodes.

Keywords:
Biasing Decoupling (probability) Ion Plasma Atomic physics Voltage Electrode Materials science Capacitively coupled plasma Radio frequency Low frequency Inductively coupled plasma Optoelectronics Physics Electrical engineering

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Citation History

Topics

Plasma Diagnostics and Applications
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Electrostatic Discharge in Electronics
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Plasma Applications and Diagnostics
Health Sciences →  Medicine →  Radiology, Nuclear Medicine and Imaging

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