Dynamic state-dependent dispatching for wafer fabrication

Abstract

A dynamic state-dependent dispatching (DSDD) heuristic for a wafer fabrication plant is presented. The DSDD heuristic dynamically uses different dispatching rules according to the state of a production system. Rather than developing new rules, the DSDD heuristic combines and modifies existing rules. This heuristic first classifies workstations into dynamic bottlenecks and non-dynamic bottlenecks. Dynamic bottleneck workstations apply a revised two-boundary dispatching rule when their queue length exceeds the average obtained from simulation using constant lot-release policy and first-in, first-out dispatching rule. Otherwise, the shortest expected processing time until next visit dispatching rule is used. A revised FGCA (FGCA+) dispatching rule is used for all non-dynamic bottlenecks workstations. Simulation results demonstrate that the DSDD heuristic obtains the best performance among the compared six dispatching rules in terms of average and standard deviation of cycle time and work-in-process.