A 180-V Si-gate MOS transistor using standard MOS LSI technology and capable of driving piezoelectric tactile displays has been developed. A novel theory predicts accurately walkout of the transistor's high-voltage junction breakdown.
Edward S. KolesarC.S. DysonR.R. RestonRobert FitchDouglas G. FordS.D. Nelms
Hung Chang LinJ. L. HalsorPatrick J. Hayes
Can YuanYongqian LiXuehuan FengZhidong Yuan
Byung‐Chang YuJong-Man KimSeung‐Hyuck LeeHoon‐Ju ChungSeung‐Woo Lee