JOURNAL ARTICLE

Optical properties of strained Si<sub>1<i>x</i></sub>Ge<sub><i>x</i></sub> and Si<sub>1<i>xy</i></sub>Ge<sub><i>x</i></sub>C<sub><i>y</i></sub> heterostructures

Z. F. Krasil’nikА. В. Новиков

Year: 2000 Journal:   Uspekhi Fizicheskih Nauk Vol: 170 (3)Pages: 338-338   Publisher: Lebedev Physical Institute

Abstract

Оптические свойства напряженных гетероструктур РЅР° РѕСЃРЅРѕРІРµ Si1–xGex Рё Si1–xyGexCy, Красильник Р—.Р¤., РќРѕРІРёРєРѕРІ Рђ.Р’.

Keywords:
Germanium X-ray crystallography Silicon Materials science Crystallography Chemistry Physics Diffraction Metallurgy Optics

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Citation History

Topics

Silicon Nanostructures and Photoluminescence
Physical Sciences →  Materials Science →  Materials Chemistry
Semiconductor materials and interfaces
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Semiconductor Quantum Structures and Devices
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics

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