Infrared optical characterization of (Cu2GeSe3)1−x (CuGe2P3)x mixed crystals

V. Riede; N. Sharif; H. Neumann; M. S. Omar; H. Sobotta

doi:10.1002/crat.2170230520

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Infrared optical characterization of (Cu₂GeSe₃)_1−x (CuGe₂P₃)_x mixed crystals

V. Riede N. Sharif H. Neumann M. S. Omar H. Sobotta

Year: 1988 Journal: Crystal Research and Technology Vol: 23 (5)Pages: 677-681 Publisher: Wiley

DOI: 10.1002/crat.2170230520

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Abstract

Abstract Infrared reflectivity spectra of (Cu 2 GeSe 3 ) 1− x (CuGe 2 P 3 ) x mixed crystals with x = 0.1 and 0.2 are measured in the wave‐number range from 180 to 4000 cm −1 . An analysis of the spectra reveals contributions from five vibrational modes and from free carriers to the reflectivity. The results are compared with previous measurements for Cu 2 GeSe 3 and CuGe 2 P 3 .

Keywords:

Infrared Infrared spectroscopy Analytical Chemistry (journal) Reflectivity Materials science Spectral line Characterization (materials science) Crystallography Chemistry Optics Physics Nanotechnology

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Infrared optical characterization of (Cu₂GeSe₃)_1−x (CuGe₂P₃)_x mixed crystals

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