SUPERCAPACITOR BEHAVIOR OF SPRAY DEPOSITEDSnO₂THIN FILMS

Abstract

Tin oxide thin films were prepared via spray pyrolysis method. The structural and morphological properties of SnO 2 thin films have been investigated using X-ray diffraction (XRD) and scanned electron microscope (SEM) analysis. The XRD pattern confirms the tetragonal rutile structure of SnO 2 with preferential orientation along (200) plane. SEM image reveals the nanocrystalline nature of the SnO 2 films. SnO 2 thin films were subjected to electrochemical tests to study the supercapacitor behavior. Maximum specific capacitance of 168 F/g at a scan rate of 25 mV/s was obtained using 0.5 M KOH as the electrolyte. This is the highest value ever reported for spray deposited tin oxide thin films.