HRTEM characterization of YBa2Cu3O7−δ thick films on LaAlO3 substrates

Jianming Zeng; Jie Lian; Luming Wang; P. Chou; A. Ignatiev

doi:10.1016/j.physc.2004.02.002

ScienceGate Book Chapters

JOURNAL ARTICLE

HRTEM characterization of YBa2Cu3O7−δ thick films on LaAlO3 substrates

Jianming Zeng Jie Lian Luming Wang P. Chou A. Ignatiev

Year: 2004 Journal: Physica C Superconductivity Vol: 405 (2)Pages: 127-132 Publisher: Elsevier BV

DOI: 10.1016/j.physc.2004.02.002

Get Full-Text PDF Get Analytical Report

Keywords:

Materials science Metalorganic vapour phase epitaxy Crystallite Amorphous solid Microstructure Transmission electron microscopy High-resolution transmission electron microscopy Chemical vapor deposition Scanning electron microscope Composite material Optoelectronics Crystallography Nanotechnology Epitaxy Metallurgy Layer (electronics) Chemistry

Metrics

Cited By

0.68

FWCI (Field Weighted Citation Impact)

Refs

0.69

Citation Normalized Percentile

Is in top 1%

Is in top 10%

Citation History

Topics

Physics of Superconductivity and Magnetism

Physical Sciences → Physics and Astronomy → Condensed Matter Physics

ZnO doping and properties

Physical Sciences → Materials Science → Materials Chemistry

Acoustic Wave Resonator Technologies

Physical Sciences → Engineering → Biomedical Engineering

HRTEM characterization of YBa2Cu3O7−δ thick films on LaAlO3 substrates

Metrics

Citation History

Topics

Related Documents

Characterization of Ba0.1Sr0.9TiO3/YBa2Cu3O7–δ heterostructures on vicinal LaAlO3 substrates

Properties of YBa2Cu3O7−δ thick films on flexible buffered metallic substrates

Preparation and characterization of microcrack-free thick YBa2Cu3O7-δ films

Miniaturized Multilayer Filters with YBa2Cu3O7-δ on LaAlO3 and MgO Substrates

YBa2Cu3O7−σ thick films on alumina substrates