JOURNAL ARTICLE

Complex permittivity and permeability measurement at elevated temperatures using rectangular waveguide

B. J. WolfsonStuart M. Wentworth

Year: 2003 Journal:   Microwave and Optical Technology Letters Vol: 38 (6)Pages: 449-453   Publisher: Wiley

Abstract

Abstract We describe a method to determine a material's complex permittivity and permeability over a range of temperatures. Input impedances are calculated from scattering parameters measured with the sample terminated by two offset shorts. These are manipulated to solve for complex permittivity and permeability over the frequency band of the waveguide. © 2003 Wiley Periodicals, Inc. Microwave Opt Technol Lett 38: 449–453, 2003; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.11086

Keywords:
Permittivity Microwave Permeability (electromagnetism) Offset (computer science) Materials science Scattering Electrical impedance Scattering parameters Relative permittivity Waveguide Electronic engineering Optics Optoelectronics Engineering Electrical engineering Dielectric Physics Computer science Telecommunications Chemistry

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9
Cited By
1.57
FWCI (Field Weighted Citation Impact)
9
Refs
0.84
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Microwave and Dielectric Measurement Techniques
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Microwave Engineering and Waveguides
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Photonic and Optical Devices
Physical Sciences →  Engineering →  Electrical and Electronic Engineering

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