Temperature dependence of structural and optical properties of GeSbTe alloy thin films

JOURNAL ARTICLE

Year: 2002 Journal: Journal of Magnetism and Magnetic Materials Vol: 249 (3)Pages: 509-512 Publisher: Elsevier BV

DOI: 10.1016/s0304-8853(02)00471-7

Keywords:

Materials science Ellipsometry Alloy Diffraction Thin film Phase (matter) Layer (electronics) Precipitation Optics Composite material Nanotechnology

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