JOURNAL ARTICLE
Determination of layer thickness with μXRF
Year: 2005 Journal: Applied Surface Science Vol: 252 (1)Pages: 53-56 Publisher: Elsevier BV
Keywords:
Calibration Materials science X-ray fluorescence Optics Layer (electronics) Surface finish Radiation Surface roughness Nondestructive testing Beam (structure) Surface layer Analytical Chemistry (journal) Fluorescence Composite material Chemistry Physics
Metrics
10
Cited By
1.46
FWCI (Field Weighted Citation Impact)
3
Refs
0.83
Citation Normalized Percentile
Is in top 1%
Is in top 10%
Citation History
Topics
X-ray Spectroscopy and Fluorescence Analysis
Physical Sciences → Physics and Astronomy → Radiation
Electron and X-Ray Spectroscopy Techniques
Physical Sciences → Materials Science → Surfaces, Coatings and Films
Cultural Heritage Materials Analysis
Social Sciences → Arts and Humanities → Archeology
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