JOURNAL ARTICLE

<title>Ultrathick Photoresist Processing</title>

D. CiarloN. M. Ceglio

Year: 1980 Journal:   Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Vol: 0221 Pages: 64-73   Publisher: SPIE

Abstract

Diazo-type positive photoresists are commonly used for pattern replication by the integrated circuit industry in a thickness range ≈ O.3-3μm. We are using these same resists at thicknesses as great as 40 μm to form electroplating molds for the fabrication of micro-Fresnel zone plates. Difficulties are encountered when films thicker than l5-18μm are used for pattern replication. Most significant of these difficulties are: i) the occurance of bulk microfractures throughout the resist volume, ii) loss of UV sensitivity, and iii) sidewall taper in high aspect ratio structures. These difficulties, with the exception of the sidewall taper, can be overcome with appropriate resist processing schedules.

Keywords:
Computer science Photoresist Materials science Nanotechnology

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Citation History

Topics

Silicon and Solar Cell Technologies
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Advancements in Photolithography Techniques
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Industrial Vision Systems and Defect Detection
Physical Sciences →  Engineering →  Industrial and Manufacturing Engineering

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