EXAFS studies of rare earth doped calcium sulphide thin films

Y. Charreire; O. Tolonen-Kivimäki; E. Nykänen; Markku Leskelä; Lauri Niinistö; D. Bonnin; O. Heckmann

doi:10.1016/0040-6090(94)90792-7

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EXAFS studies of rare earth doped calcium sulphide thin films

Y. Charreire O. Tolonen-Kivimäki E. Nykänen Markku Leskelä Lauri Niinistö D. Bonnin O. Heckmann

Year: 1994 Journal: Thin Solid Films Vol: 247 (2)Pages: 151-155 Publisher: Elsevier BV

DOI: 10.1016/0040-6090(94)90792-7

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Keywords:

Extended X-ray absorption fine structure Thin film Doping Rare earth Analytical Chemistry (journal) Absorption (acoustics) Materials science Luminescence Chemistry Mineralogy Crystallography Absorption spectroscopy Optics Nanotechnology Optoelectronics Physics Chromatography

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X-ray Spectroscopy and Fluorescence Analysis

Physical Sciences → Physics and Astronomy → Radiation

Luminescence Properties of Advanced Materials

Physical Sciences → Materials Science → Materials Chemistry

Rare-earth and actinide compounds

Physical Sciences → Physics and Astronomy → Condensed Matter Physics

EXAFS studies of rare earth doped calcium sulphide thin films

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