We have experimentally observed and modeled a second-order transport mechanism near breakdown in large-diameter (small-gap) semiconducting SWNTs. We determine impact ionization to be the primary cause of the up-kick in current. Subsequent simulations taking impact ionization into account provide a theoretical match to our experimentally observed current tail.
Étienne GaufrèsNicolas IzardXavier Le RouxSaïd KazaouiDelphine Marris‐MoriniÉric CassanLaurent Vivien
Jean‐Sébastien LauretChristophe VoisinG CassaboisPhilippe RoussignolC. DelalandeArianna FiloramoLaurence CapesElizabeth ValentinO. Jost
Richard MartelVincent DeryckeC. LavoieJoerg AppenzellerK. ChanJ. TersoffPhaedon Avouris
Giancarlo SoaviAlexander GruppArne BudwegFrancesco ScotognellaTimo HefnerTobias HertelGuglielmo LanzaniAlfred LeitenstorferGiulio CerulloDaniele Brida
Kousik SivakumarShaoxin LuBalaji Panchapakesan