Xiaohua LiuX. Y. ChenJiang YinZ. G. LiuJun‐Min LiuXiaobo YinG. X. ChenMin Wang
Rutile-phase TiO2 thin films have been epitaxially grown on GaAs(100) substrates at 700 °C under 5 Pa oxygen ambient pressure, and at room temperature (30 °C) and 5×10−4 Pa base vacuum by KrF pulsed excimer laser deposition. The [110]-oriented TiO2 films were composed of two types of domains perpendicular to each other in the plane. From atomic force microscopy analysis, the epitaxial films had a surface with roughness less than 7 nm in root-mean-square.
Xiaohua LiuJinde YinZ.G. LiuXiaobo YinG.X. ChenM. Wang
Hiroshi SakamaG. OsadaMasanori TsukamotoAtsushi TanokuraNoriya Ichikawa
Nana NishiyamaHisanori MashikoK. YoshimatsuKoji HoribaHiroshi KumigashiraAkira Ohtomo
S.S. ShushtarianSatishchandra OgaleG. N. ChaudhariPrabhat SinghV. Jayathirtha Rao
Shi‐Liang LiuShengming ZhouYinzhen WangXia ZhangXiaomin LiChangtai XiaHang YinJun Xu