Measurement of dielectric properties of high-absorption materials at microwave frequencies

É. R. Kasimov; M. A. Sadykhov; R. M. Kasimov; Ч. О. Каджар

doi:10.1007/bf02504472

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Measurement of dielectric properties of high-absorption materials at microwave frequencies

É. R. Kasimov M. A. Sadykhov R. M. Kasimov Ч. О. Каджар

Year: 1999 Journal: Measurement Techniques Vol: 42 (5)Pages: 475-478 Publisher: Springer Science+Business Media

DOI: 10.1007/bf02504472

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Keywords:

Dielectric Materials science Microwave Absorption (acoustics) Dielectric loss Reflection (computer programming) Optics Electromagnetic radiation Composite material Optoelectronics Physics

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Microwave and Dielectric Measurement Techniques

Physical Sciences → Engineering → Electrical and Electronic Engineering

Optical Coatings and Gratings

Physical Sciences → Materials Science → Surfaces, Coatings and Films

Measurement of dielectric properties of high-absorption materials at microwave frequencies

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