Microstructural and Dielectric Characterization of Sol-Gel Derived Silicon Oxycarbide Glass Sheets

N. Suyal; T. Krajewski; Martin Mennig

doi:10.1023/a:1008740218534

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Microstructural and Dielectric Characterization of Sol-Gel Derived Silicon Oxycarbide Glass Sheets

N. Suyal T. Krajewski Martin Mennig

Year: 1999 Journal: Journal of Sol-Gel Science and Technology Vol: 14 (1)Pages: 113-123 Publisher: Springer Science+Business Media

DOI: 10.1023/a:1008740218534

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Keywords:

Materials science Raman spectroscopy Scanning electron microscope Crystallite Amorphous solid Dielectric Microstructure Composite material Silicon Sol-gel Transmission electron microscopy High-resolution transmission electron microscopy Analytical Chemistry (journal) Nanotechnology Crystallography Metallurgy Optics

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Diamond and Carbon-based Materials Research

Physical Sciences → Materials Science → Materials Chemistry

Advanced ceramic materials synthesis

Physical Sciences → Materials Science → Ceramics and Composites

Glass properties and applications

Physical Sciences → Materials Science → Ceramics and Composites

Microstructural and Dielectric Characterization of Sol-Gel Derived Silicon Oxycarbide Glass Sheets

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