Machine vision system for curved surface inspection

Min‐Fan Ricky Lee; Clarence W. de Silva; Elizabeth A. Croft; Q. M. Jonathan Wu

doi:10.1007/s001380000043

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JOURNAL ARTICLE

Machine vision system for curved surface inspection

Min‐Fan Ricky Lee Clarence W. de Silva Elizabeth A. Croft Q. M. Jonathan Wu

Year: 2000 Journal: Machine Vision and Applications Vol: 12 (4)Pages: 177-188 Publisher: Springer Science+Business Media

DOI: 10.1007/s001380000043

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Keywords:

Computer vision Artificial intelligence Structured light Curvature Computer science Triangulation Geodetic datum Linearity System of measurement Mathematics Engineering Geology Geometry

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Topics

Image Processing Techniques and Applications

Physical Sciences → Engineering → Media Technology

Optical measurement and interference techniques

Physical Sciences → Computer Science → Computer Vision and Pattern Recognition

Advanced Measurement and Detection Methods

Physical Sciences → Engineering → Electrical and Electronic Engineering

Machine vision system for curved surface inspection

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Citation History

Topics

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