Structural Properties of CuGaxIn1-xSe2 Thin Films Deposited by Spray Pyrolysis

Abstract

Thin films of CuGaxIn1-xSe2 (x=0.0-1.0) have been prepared by spray pyrolysis onto soda-lime glass substrates heated to a temperature of 325° C. The structure, crystal orientations, lattice parameters and grain size of the experimental films have been studied using the X-ray diffraction and scanning electron microscopy. All the deposited films were polycrystalline and showed single phase with an intense (112) orientation. The lattice parameters, a and c of the films vary linearly with the change of gallium composition. The grain size of the films decrease with the increase of gallium content.