JOURNAL ARTICLE

High resolution electron microscopy of InAs/GaAs strained-layer superlattices

C. d’AnterrochesJ. Y. MarzinG. Le RouxLeon J. Goldstein

Year: 1987 Journal:   Journal of Crystal Growth Vol: 81 (1-4)Pages: 121-129   Publisher: Elsevier BV
Keywords:
Superlattice Tetragonal crystal system Transmission electron microscopy Molecular beam epitaxy Materials science Epitaxy Optoelectronics Layer (electronics) Diffraction Thin film Electron diffraction High-resolution transmission electron microscopy Optics Condensed matter physics Crystallography Chemistry Nanotechnology Crystal structure Physics

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Topics

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Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Advanced Semiconductor Detectors and Materials
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Semiconductor materials and interfaces
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
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