JOURNAL ARTICLE

Micromachining applications of a high resolution ultrathick photoresist

Kangsik LeeN. LaBiancaS. A. RishtonS. ZolgharnainJeffrey D. GelormeJane M. ShawT. H. P. Chang

Year: 1995 Journal:   Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena Vol: 13 (6)Pages: 3012-3016   Publisher: American Institute of Physics

Abstract

This article describes a new negative-tone photoresist, SU-8, for ultrathick layer applications. An aspect ratio of 10:1 has been achieved using near-ultraviolet lithography in a 200-μm-thick layer. The use of this resist for building tall micromechanical structures by deep silicon reactive-ion etching and electroplating is demonstrated. Using SU-8 stencils, etched depths of ≳200 μm in Si and electroplated 130-μm-thick Au structures with near-vertical sidewalls have been achieved.

Keywords:
Photoresist Electroplating Surface micromachining Resist Materials science Reactive-ion etching Etching (microfabrication) Layer (electronics) Deep reactive-ion etching Lithography Silicon Optoelectronics Microelectromechanical systems Photolithography Nanotechnology Fabrication

Metrics

379
Cited By
6.60
FWCI (Field Weighted Citation Impact)
0
Refs
0.98
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Advanced Machining and Optimization Techniques
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Advanced MEMS and NEMS Technologies
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Analytical Chemistry and Sensors
Physical Sciences →  Chemical Engineering →  Bioengineering

Related Documents

JOURNAL ARTICLE

Applications of Novel High-Aspect-Ratio Ultrathick UV Photoresist for Microelectroplating

Matthias StaabFelix GreinerMichael SchlosserHelmut F. Schlaak

Journal:   Journal of Microelectromechanical Systems Year: 2011 Vol: 20 (4)Pages: 794-796
JOURNAL ARTICLE

Characterization of an ultrathick positive photoresist for electroplating applications

Brad AvritEdward W. MaxwellLisa M. HuynhElliott S. Capsuto

Journal:   Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Year: 2004 Vol: 5376 Pages: 929-929
JOURNAL ARTICLE

<title>X-ray micromachining of high-aspect-ratio MEMS using SU8 ultrathick photoresist</title>

Chantal G. Khan Malek

Journal:   Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Year: 2001 Vol: 4234 Pages: 338-345
© 2026 ScienceGate Book Chapters — All rights reserved.