Molecular dynamics simulations of Kapitza length for argon-silicon and water-silicon interfaces

An T. Pham; Murat Barışık; BoHung Kim

doi:10.1007/s12541-014-0341-x

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Molecular dynamics simulations of Kapitza length for argon-silicon and water-silicon interfaces

An T. Pham Murat Barışık BoHung Kim

Year: 2014 Journal: International Journal of Precision Engineering and Manufacturing Vol: 15 (2)Pages: 323-329 Publisher: Springer Science+Business Media

DOI: 10.1007/s12541-014-0341-x

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Keywords:

Thermal conduction Materials science Silicon Molecular dynamics Thermal resistance Thermal conductivity Interfacial thermal resistance Thermal Computer cooling Nanoscopic scale Length scale Nanotechnology Mechanics Thermodynamics Composite material Mechanical engineering Chemistry Thermal management of electronic devices and systems Optoelectronics Physics

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Thermal properties of materials

Physical Sciences → Materials Science → Materials Chemistry

Thermal Radiation and Cooling Technologies

Physical Sciences → Engineering → Civil and Structural Engineering

Advanced Thermoelectric Materials and Devices

Physical Sciences → Materials Science → Materials Chemistry

Molecular dynamics simulations of Kapitza length for argon-silicon and water-silicon interfaces

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