Characterization of MgTiO ₃ –CaTiO ₃ ‐Layered Microwave Dielectric Resonators with TE _01δ Mode

Abstract

MgTiO 3 and CaTiO 3 ceramics were stacked in different schemes as the key components of the microwave dielectric resonators, and the microwave dielectric characteristics were evaluated with TE 01δ resonant mode. With increasing thickness fraction of CaTiO 3 , the resonant frequency and Q × f value decreased, while the effective dielectric constant and temperature coefficient of resonant frequency increased. The microwave dielectric characteristics were also affected by the stacking scheme. These effects were analyzed by the finite‐element method, and the predicted characteristics agreed well with the experimental results. It was indicated that the temperature‐stable resonators with high‐ Q × f values could be attained by changing the thickness fractions of CaTiO 3 , and the corresponding microwave dielectric characteristics could also be predicted by the finite‐element method.