JOURNAL ARTICLE

Astigmatism measurement by lateral shearing interferometer

Zhi-Qiang LiuK. SugisakiMikihiko IshiiYucong ZhuJun SaitoAkiyosi SuzukiMasanobu HasegawaKatsuhiko Murakami

Year: 2004 Journal:   Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena Vol: 22 (6)Pages: 2980-2983   Publisher: American Institute of Physics

Abstract

In the lateral shearing interferometer for EUVL PO at-wavelength measurement, a grating is used to separate and shear the test wavefront. Normally, the astigmatism component of the test wavefront is difficult to be measured from the phase distribution tilt because the grating position influences it also. We found the grating position influences the tilt component of the interferogram phase distribution along the shear direction only. A part of the astigmatism can be measured from the tilt component perpendicular to the shear direction. To measure the other part of astigmatism, we perform a measurement with the shear direction in 45°. From the tilt component of the phase distribution in 135°, the other part of the astigmatism can be measured. By these two measurements, the whole astigmatism can be measured. We analyzed the measurement errors and showed the conditions for high accuracy astigmatism measurement.

Keywords:
Optics Tilt (camera) Wavefront Grating Shearing interferometer Interferometry Astigmatism Shearing (physics) Physics Wavelength Perpendicular Astronomical interferometer Geometry Mathematics

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Topics

Optical measurement and interference techniques
Physical Sciences →  Computer Science →  Computer Vision and Pattern Recognition
Advanced Measurement and Metrology Techniques
Physical Sciences →  Engineering →  Mechanical Engineering
Adaptive optics and wavefront sensing
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics

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