Reliability of Pb(Mg,Nb)O3–Pb(Zr,Ti)O3 multilayer ceramic piezoelectric actuators by Weibull method

Jung-Hyuk Koh; Tae-Geun Kim

doi:10.1016/j.microrel.2005.04.011

ScienceGate Book Chapters

JOURNAL ARTICLE

Reliability of Pb(Mg,Nb)O3–Pb(Zr,Ti)O3 multilayer ceramic piezoelectric actuators by Weibull method

Jung-Hyuk Koh Tae-Geun Kim

Year: 2005 Journal: Microelectronics Reliability Vol: 46 (1)Pages: 183-188 Publisher: Elsevier BV

DOI: 10.1016/j.microrel.2005.04.011

Get Full-Text PDF Get Analytical Report

Keywords:

Weibull distribution Ceramic Actuator Materials science Reliability (semiconductor) Composite material Electrode Piezoelectricity Power (physics) Electrical engineering Engineering Thermodynamics Mathematics Statistics Physics

Metrics

Cited By

0.00

FWCI (Field Weighted Citation Impact)

Refs

0.09

Citation Normalized Percentile

Is in top 1%

Is in top 10%

Citation History

Topics

Ferroelectric and Piezoelectric Materials

Physical Sciences → Materials Science → Materials Chemistry

Acoustic Wave Resonator Technologies

Physical Sciences → Engineering → Biomedical Engineering

Piezoelectric Actuators and Control

Physical Sciences → Engineering → Control and Systems Engineering

Reliability of Pb(Mg,Nb)O3–Pb(Zr,Ti)O3 multilayer ceramic piezoelectric actuators by Weibull method

Metrics

Citation History

Topics

Related Documents

Aging of piezoelectric properties in Pb(MgNb)O3-Pb(ZrTi)O3 multilayer ceramic actuators

Piezoelectric properties of (Pb, Sr) (Zr, Ti, Mn, Zn, Nb)O3 piezoelectric ceramic

Textured Pb(Zr,Ti)O3-Pb[(Zn,Ni)1/3Nb2/3]O3 multilayer ceramics and their application to piezoelectric actuators

Piezoelectric coefficients of multilayer Pb(Zr,Ti)O3 thin films

Piezoelectric Pb(Ni,Nb)O3-Pb(Zr,Ti)O3 multilayer ceramics using Cu-Ag electrodes reduced by hydrazine solution treatment