JOURNAL ARTICLE

Inelastic Electron Tunneling Spectroscopy on Decanethiol at Elevated Temperatures

A.S.V.M. HallbäckNuri OncelJurriaan HuskensHarold J. W. ZandvlietBene Poelsema

Year: 2004 Journal:   Nano Letters Vol: 4 (12)Pages: 2393-2395   Publisher: American Chemical Society

Abstract

Inelastic electron tunneling spectroscopy (IETS) measurements using scanning tunneling microscopy (STM) on a decanethiol self-assembled monolayer on Au(111) are presented. The results presented are obtained in the temperature range 77-300 K, which is a much higher temperature than what is commonly used for STM-IETS measurements. Two peaks at ±34 meV (probably Au-S or S-C stretch mode) and ±156 meV (C-C stretch mode or a CH2 mode) are resolved.

Keywords:
Inelastic electron tunneling spectroscopy Scanning tunneling microscope Spectroscopy Scanning tunneling spectroscopy Quantum tunnelling Monolayer Atmospheric temperature range Electron Condensed matter physics Chemistry Materials science Analytical Chemistry (journal) Nanotechnology Physics

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40
Cited By
1.48
FWCI (Field Weighted Citation Impact)
11
Refs
0.83
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Molecular Junctions and Nanostructures
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Surface and Thin Film Phenomena
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Semiconductor materials and interfaces
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics

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