JOURNAL ARTICLE

Two-wavelength phase shift interferometry to characterize ballistic features

Glenn W. PaganoChristopher Mann

Year: 2014 Journal:   Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Vol: 9131 Pages: 91311K-91311K   Publisher: SPIE

Abstract

We apply two-wavelength phase shifting interferometry to generate 3D surface profile maps of spent bullet cartridge cases. From the captured interferograms, an optimized algorithm was used to calculate a phase profile from which a precise digital surface map of the cartridge casing may be produced. This 3D surface profile is used to enhance a firearms examiner's ability to uniquely identify distinct features or toolmarks imprinted on the casing when the weapon is fired. These features play a key role in the matching process of ballistic forensic examination.

Keywords:
Interferometry Cartridge Casing Wavelength Phase (matter) Optics Digital holography Process (computing) Computer science Matching (statistics) Materials science Engineering Physics Holography Mechanical engineering Mathematics

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5
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0.57
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Citation History

Topics

Optical measurement and interference techniques
Physical Sciences →  Computer Science →  Computer Vision and Pattern Recognition
Advanced Optical Sensing Technologies
Physical Sciences →  Physics and Astronomy →  Instrumentation
Digital Holography and Microscopy
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics

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