Growth of Textured Nanocrystalline Cobalt Ferrite Thin Films by Pulsed Laser Deposition

Abstract

Cobalt ferrite thin films have been deposited on fused quartz substrates by pulsed laser deposition at various substrate temperatures, T S (25 °C, 300 °C, 550 °C and 750 °C). Single phase, nanocrystalline, spinel cobalt ferrite formation is confirmed by X-ray diffraction (XRD) for T S ≥ 300 °C. Conventional XRD studies reveal strong (111) texturing in the as deposited films with T S ≥ 550 °C. Bulk texture measurements using X-ray orientation distribution function confirmed (111) preferred orientation in the films with T S ≥ 550 °C. Grain size (13–16 nm for T S ≥ 300 °C) estimation using grazing incidence X-ray line broadening analysis shows insignificant grain growth with increasing T S , which is in good agreement with grain size data obtained from transmission electron microscopy.