This paper investigates the silicon surfaces structured by femtosecond laser pulses by the scanning electron microscopy (SEM), atomic-force microscopy (AFM), third-harmonic (TH) generation, photoluminescence (PL), and Raman spectroscopy techniques.
Hao LuoHaibo YuYangdong WenShendi LiXiaoduo WangYe QiuLianqing Liu
Guoliang DengXianheng YangGuoying FengShouhuan Zhou
Laura GeminiMasaki HashidaMasahiro ShimizuYasuhiro MiyasakaShunsuke InoueShigeki TokitaJ. LimpouchTomáš MocekShuji Sakabe
Naoki YasumaruKenzo MiyazakiJunsuke Kiuchi
Bin ZhangLu ShiLingrui ChuLingqi LiS. JuodkazisFeng Chen