Abstract

This paper investigates the silicon surfaces structured by femtosecond laser pulses by the scanning electron microscopy (SEM), atomic-force microscopy (AFM), third-harmonic (TH) generation, photoluminescence (PL), and Raman spectroscopy techniques.

Keywords:
Femtosecond Materials science Silicon Raman spectroscopy Photoluminescence Scanning electron microscope Laser Optoelectronics Nanostructure Microscopy Spectroscopy Atomic force microscopy Optics Nanotechnology Physics

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Topics

Laser Material Processing Techniques
Physical Sciences →  Engineering →  Computational Mechanics
Ion-surface interactions and analysis
Physical Sciences →  Engineering →  Computational Mechanics
Ocular and Laser Science Research
Health Sciences →  Medicine →  Ophthalmology

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