Measurement of in-plane strains using electronic speckle and electronic speckle-shearing pattern interferometry

Abstract

Abstract This letter reports the application of the electronic speckle and electronic speckle-shearing pattern interferometry for determining the first-order partial derivatives of in-plane displacements. Two possibilities of obtaining the in-plane strain contours are described. Experimental results showing the in-plane strain and the in-plane shearing strain contours on a tensile test specimen are presented.